Bio:

Marc Chaigneau is the R&D Director of HORIBA France, and the Field Leader for Semiconductor Metrology Solutions of HORIBA Group.

He earned a Ph.D. in Solid-State Physics from the University of Nantes in 2007 and held a tenured research position at École Polytechnique from 2010 to 2015. Then Marc joined HORIBA Scientific, where he led global Scanning Probe Microscopy (SPM) development and strategic marketing initiatives. His contributions were recognized with HORIBA’s IP Award in 2016 and the Presidential Achievement Award in 2020. In 2023, he was appointed Head of Semiconductor Metrology for the HORIBA Group, focusing on solutions for photomask, wafer, and thin-film inspection. Since 2026, as R&D Director of HORIBA France, he has been leading innovation and product development for the semiconductor, energy, and pharmaceutical markets.