Bio:

Dr. Chun-Ting Liu is the founder and CEO of NanoSeeX, a deep-tech company developing advanced X-ray metrology systems for semiconductor manufacturing. His work focuses on non-destructive nanoscale characterization using X-ray scattering and reflectometry techniques for advanced logic nodes and emerging transistor architectures, including nanosheet Gate-All-Around (GAA) and future CFET structures. He leads NanoSeeX’s technology strategy and collaborates with international research institutes and semiconductor ecosystem partners on next-generation semiconductor metrology solutions.